Model training method and apparatus
US11669729B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2019 |
| Grant date | Jun 6, 2023 |
| Priority date | — |
| Expiry date | Nov 24, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus includes processing circuitry configured to: obtain first trained parameters for a model, wherein the first trained parameters have been generated by training the model using data from a first data cohort; obtain second trained parameters for the model, wherein the second trained parameters have been generated by training the model using data from a second, different data cohort; determine a first evaluation value by inputting data from the first data cohort into a model having the first trained parameters; and determine a second evaluation value by inputting data from the first data cohort into a model having the second trained parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.