Object area measurement method, electronic device and storage medium
US11669990B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 26, 2021 |
| Grant date | Jun 6, 2023 |
| Priority date | — |
| Expiry date | Jan 26, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An object area measurement method and an apparatus are provided, relating to the computer vision and deep learning technology. The method includes acquiring an original image with a spatial resolution, the original image including a target object; acquiring an object identification model including at least two sets of classification models; generating one or more original image blocks based on the original image; performing operations on each original image block: scaling each original image block at at least two scaling levels to obtain scaled image blocks with at least two sizes, the scaled image blocks respectively corresponding to the at least two sets of classification models, and inputting the scaled image blocks into the object identification model to obtain an identification result of the target object; and determining an area of the target object based on the respective identification results of the one or more original image blocks and the spatial resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.