Near-field test apparatus for far-field antenna properties
US11671144B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2019 |
| Grant date | Jun 6, 2023 |
| Priority date | — |
| Expiry date | Oct 4, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B5/22
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Devices and methods for testing microelectronic assemblies including wireless communications are disclosed herein. For example, in some embodiments, a wireless testing system may include a radio frequency (RF) shielded chamber; a device under test (DUT) in the RF shielded chamber, wherein the DUT includes an array of first antenna elements; a testing apparatus in the RF shielded chamber including an array of second antenna elements at a first surface of a substrate to receive a test signal from the DUT, wherein a distance between individual second antenna elements and an adjacent second antenna element is at least half of a wavelength of the test signal, and wherein a distance between the first antenna elements and the second antenna elements is within a near-field region; and an array of electrical switches, wherein an individual electrical switch is coupled to a respective individual second antenna element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.