Dual magnetometer calibration
US11675040B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2020 |
| Grant date | Jun 13, 2023 |
| Priority date | — |
| Expiry date | May 10, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/091
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Examples of systems and methods for calibrating or operating a magnetic sensor for sensor temperature or operating conditions are provided. The magnetic sensor can comprise a dual magnetometer sensor that comprises a first, low-power-consumption magnetometer (e.g., a magneto-inductive magnetometer) and a second higher-power-consumption magnetometer (e.g., a magneto-resistive magnetometer). The second magnetometer can have a lower unit-to-unit variation in temperature calibration parameters and can be used to temperature-correct readings from the first magnetometer. The magnetic sensor can dynamically switch between usage of the first magnetometer and the second magnetometer in order to provide a dynamic sample rate that can depend on conditions within the sensor or external to the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.