Systems and methods for validation of artificial intelligence models
US11676048B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2019 |
| Grant date | Jun 13, 2023 |
| Priority date | — |
| Expiry date | Nov 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/17
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are described which relate to machine learning model validation. A first machine learning model may be trained to dependent variable data for a first population. A second machine learning model may be trained to simulate dependent variable data for the first population. The second machine learning model may then be applied to student activity data of a second population having different characteristics from the first population to produce simulated dependent variable data. The first machine learning model may then generate predictions for the second population, which may be validated via comparison to the simulated dependent variable data. A given simulated dependent variable value may be generated by the second machine learning model at a specific time TX, where some features input to the machine learning model may be derived from datapoints occurring before TX and others being derived from datapoints occurring after TX.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.