X-ray fluorescence analyzer system and a method for performing X-ray fluorescence analysis of an element of interest in slurry
US11680913B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2019 |
| Grant date | Jun 20, 2023 |
| Priority date | — |
| Expiry date | Feb 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/062
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray fluorescence analyzer system including an X-ray tube, a slurry handling unit, and a crystal diffractor located in a first direction from the slurry handling unit. The crystal diffractor separates a predefined wavelength range from fluorescent X-rays that propagate into the first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector. The crystal diffractor includes a pyrolytic graphite crystal. The predefined wavelength range includes characteristic fluorescent radiation of a pre-defined element of interest with its atomic number Z between 41 and 60, the ends included. An energy resolution of the radiation detector is better than 600 eV at the energy of the characteristic fluorescent radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.