Methods and systems for 3D structure estimation using non-uniform refinement
US11680914B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2018 |
| Grant date | Jun 20, 2023 |
| Priority date | — |
| Expiry date | Sep 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/401
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided systems and methods for generating 3D structure estimation of at least one target from a set of 2D Cryo-electron microscope particle images. The method includes: receiving the set of 2D particle images of the target from a Cryo-electron microscope; splitting the set of particle images into at least a first half-set and a second half-set; iteratively performing: determining local resolution estimation and local filtering on at least a first half-map associated with the first half-set and a second half-map associated with the second half-set; aligning 2D particles from each of the half-sets using at least one region of the associated half-map; for each of the half-maps, generating an updated half-map using the aligned 2D particles from the associated half-set; and generating a resultant 3D map using all the half-maps.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.