Method of performing a measurement of a device under test
US11680971B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2021 |
| Grant date | Jun 20, 2023 |
| Priority date | — |
| Expiry date | Oct 13, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of performing a measurement of a device under test by using an antenna array. The method includes: providing an antenna array that includes several antenna elements; providing a device under test configured to communicate over-the-air; locating the device under test at a first test location, thereby establishing a first relative distance between the device under test and the antenna array; performing a first measurement over-the-air when the first relative distance is provided between the device under test and the antenna array, thereby obtaining first measurement results; moving the antenna array and/or the device under test, thereby establishing a second relative distance between the device under test and the antenna array; and performing a second measurement over-the-air when the second relative distance is provided between the device under test and the antenna array, thereby obtaining second measurement results, wherein a quiet zone is established, in which the device under test is located, and wherein the size of the quiet zone is derived from a combination of at least two transfer functions associated with the first measurement results and the second measurement resu…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.