Patent · US Active

Method for monitoring polarization quality of piezoelectric film

US11680974B2 · kind B2 · utility

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8Claims
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Key dates

Filing dateMay 25, 2021
Grant dateJun 20, 2023
Priority date
Expiry dateNov 20, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N30/857
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for monitoring polarization quality of a piezoelectric film is described. In this method, a detection step is performed on a piezoelectric film by using a detection device with a non-contact method during a polarization process of the piezoelectric film, to obtain a static electricity information or a transmittance information. A determination step is performed by using the static electricity information or the transmittance information to determine a polarization degree of the piezoelectric film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.