Patent · US Active

Diffraction imaging using pseudo dip-angle gather

US11681043B2 · kind B2 · utility

0Cited by
57References
14Claims
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Key dates

Filing dateSep 3, 2019
Grant dateJun 20, 2023
Priority date
Expiry dateSep 18, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/20032
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, methods, and apparatuses for generating a subsurface image using diffraction energy information are disclosed. The systems, methods, and apparatuses may include converting a shot gather into one or more plane-wave gather using a Radon transform. The plane-wave gathers may be extrapolated into source-side wavefields and receiver-side wavefields and further generate a pseudo dip-angle gather. The diffraction energy information may be extracted from the pseudo dip-angle gather, and an image containing subsurface features may be generated from the extracted diffraction energy information. The receiver-side wavefields may be decomposed using a recursive Radon transform.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.