Diffraction imaging using pseudo dip-angle gather
US11681043B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 3, 2019 |
| Grant date | Jun 20, 2023 |
| Priority date | — |
| Expiry date | Sep 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods, and apparatuses for generating a subsurface image using diffraction energy information are disclosed. The systems, methods, and apparatuses may include converting a shot gather into one or more plane-wave gather using a Radon transform. The plane-wave gathers may be extrapolated into source-side wavefields and receiver-side wavefields and further generate a pseudo dip-angle gather. The diffraction energy information may be extracted from the pseudo dip-angle gather, and an image containing subsurface features may be generated from the extracted diffraction energy information. The receiver-side wavefields may be decomposed using a recursive Radon transform.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.