Determination of candidate features for deviation analysis
US11681715B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2021 |
| Grant date | Jun 20, 2023 |
| Priority date | — |
| Expiry date | Oct 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/0201
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods include determination, determine, for each of a plurality of discrete features, of statistics for each discrete value of the discrete feature based on values of a continuous feature associated with the discrete value, determination, for each discrete feature, of first summary statistics based on the statistics determined for each discrete value of the discrete feature, determination, for each discrete feature, of a dissimilarity based on the first summary statistics determined for the discrete feature and on the statistics determined for each discrete value of the discrete feature, determination of candidate discrete features of the discrete features based on the determined dissimilarities, the candidate discrete features comprising less than all of the discrete features, determination, for each of the candidate discrete features, of second summary statistics based on values of the continuous feature associated with each discrete value of the candidate discrete feature, determine of a deviation score for each of the candidate discrete features based on the second summary statistics, and presentation of the candidate discrete features based on the determined devi…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.