System and method for automated sampling and analysis
US11686653B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2021 |
| Grant date | Jun 27, 2023 |
| Priority date | — |
| Expiry date | Sep 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for facilitating automated handling using laser ablation system is described that includes a sample generation system. In an embodiment, the sample generation system can include a sample chamber with a sample chamber body, a transmission window and a sealing member coupled to the sample chamber body, an inlet conduit extending through the sample chamber body and intersecting a sidewall of the interior space, and an outlet conduit extending through the sample chamber body and intersecting at least one of the sidewall of the interior or a lower surface of the sample chamber body; a placement system including a frame, and an actuator assembly coupled to the frame, where the actuator assembly is configured to place the sample adjacent to the sample chamber for laser ablation; and a laser configured to produce a laser beam that is propagated along a beam path to irradiate the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.