Semiconductor devices and methods for time-of-flight and proximity measurements
US11688998B2 · kind B2 · utility
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Key dates
| Filing date | Dec 3, 2018 |
| Grant date | Jun 27, 2023 |
| Priority date | — |
| Expiry date | Nov 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An emitter of electromagnetic radiation is configured for modes of operation providing fields of illumination of different widths, and a photodetector is configured for time-of-flight and proximity measurements by detecting electromagnetic radiation that is emitted by the emitter and reflected to the photodetector. The emitter is operated by a driver, which is configured for an alternation between the modes of operation. A time-of-flight measurement is performed when the field of illumination is narrow, and a proximity or ambient light measurement is performed when the field of illumination is wide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.