Conductive particle and testing socket comprising the same
US11693027B2 · kind B2 · utility
0Cited by
2References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 7, 2021 |
| Grant date | Jul 4, 2023 |
| Priority date | — |
| Expiry date | Oct 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An embodiment of the present invention provides a conductive particle used for a testing socket electrically connecting a lead of a device to be tested and a pad of a test board by being arranged between the device to be tested and the test board, wherein the conductive particle comprises a plurality of protrusions formed at equal intervals along a circumference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.