Monitoring waveforms from waveform generator at device under test
US11693046B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2018 |
| Grant date | Jul 4, 2023 |
| Priority date | — |
| Expiry date | Jul 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/2506
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test and measurement instrument including a signal generator configured to generate a waveform to be sent over a cable to a device under test (DUT) and a real-time waveform monitor (RTWM) circuit. The RTWM is configured to determine a propagation delay of the cable, capture a first waveform, including an incident waveform and a reflection waveform at a first test point between the signal generator and the DUT, capture a second waveform including at least the incident waveform at a second test point between the signal generator and the DUT, determine a reflection waveform and the incident waveform based on the first waveform and the second waveform, and determine a DUT waveform based on the incident waveform, the reflection waveform, and the propagation delay. The DUT waveform represents the waveform generated by the signal generator as received by the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.