Enhanced in-system test coverage based on detecting component degradation
US11693753B2 · kind B2 · utility
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Key dates
| Filing date | Oct 15, 2019 |
| Grant date | Jul 4, 2023 |
| Priority date | — |
| Expiry date | Jun 13, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In various examples, permanent faults in hardware component(s) and/or connections to the hardware component(s) of a computing platform may be predicted before they occur using in-system testing. As a result of this prediction, one or more remedial actions may be determined to enhance the safety of the computing platform (e.g., an autonomous vehicle). A degradation rate of a performance characteristic associated with the hardware component may be determined, detected, and/or computed by monitoring values of performance characteristics over time using fault testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.