Patent · US Active

Quality inspection data distributed ledger

US11695910B2 · kind B2 · utility

0Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 2022
Grant dateJul 4, 2023
Priority date
Expiry dateMay 3, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N13/254
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.