Optical temperature measurements in photonic circuits
US11698308B2 · kind B2 · utility
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3References
20Claims
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Key dates
| Filing date | Oct 5, 2020 |
| Grant date | Jul 11, 2023 |
| Priority date | — |
| Expiry date | Jan 15, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/141
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Temperature measurements of photonic circuit components may be performed optically, exploiting a temperature-dependent spectral property of the photonic device to be monitored itself, or of a separate optical temperature sensor placed in its vicinity. By facilitating measurements of the temperature of the individual photonic devices rather than merely the photonic circuit at large, such optical temperature measurements can provide more accurate temperature information and help improve thermal design.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.