Method of simulating an effect of interactions between a device under test and a scattering object and hybrid OTA test system
US11698401B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2022 |
| Grant date | Jul 11, 2023 |
| Priority date | — |
| Expiry date | Feb 4, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of simulating an effect of interactions between a device under test and a scattering object by of a hybrid over-the-air (OTA) test system is described. The method includes the steps of determining at least one radiation parameter of the device under test, wherein the at least one radiation parameter is associated with electromagnetic waves emitted by the device under test; determining an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test; assigning material properties to a Huygens box confined by the Huygens surface, wherein the material properties are associated with at least one of reflection of electromagnetic waves and absorption of electromagnetic waves; and simulating an electromagnetic interaction between the device under test and the scattering object based on the determined equivalent source and based on the assigned material properties.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.