Multi-lane optical-electrical device testing using automated testing equipment
US11700057B2 · kind B2 · utility
0Cited by
2References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 15, 2022 |
| Grant date | Jul 11, 2023 |
| Priority date | — |
| Expiry date | Jul 15, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.