Automated feature analysis of a structure
US11700360B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2021 |
| Grant date | Jul 11, 2023 |
| Priority date | — |
| Expiry date | Jul 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/176
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An automated structural feature and analysis system is disclosed. A 3D device emits a volume scanning 3D beam that scans a structure to generate 3D data that is associated with a distance between the 3D device and each end point of the 3D beam positioned on the structure. An imaging device captures an image of the structure to generate image data with the structure as depicted by the image of the structure. A controller fuses the 3D data of the structure generated by the 3D device with the image data of the structure generated by the imaging device to determine the distance between the 3D device and each end point of the 3D beam positioned on the structure and to determine a distance between each point on the image. The controller generates a sketch image of the structure that is displayed to the user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.