In-situ tensile device for X-ray tests
US11703430B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2022 |
| Grant date | Jul 18, 2023 |
| Priority date | — |
| Expiry date | Dec 30, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0641
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An in-situ tensile device for X-ray tests is provided, including: a frame including a connecting structure, where the connecting structure is configured to fixedly connect to a testing bench of a testing device; a stretching mechanism, disposed on the frame; a clamping mechanism, including two clamping assemblies arranged opposite to each other in a length direction; where the two clamping assemblies are configured to clamp two ends of a testing piece, the testing piece is provided with a testing surface, and the testing surface is disposed on surfaces of the two clamping assemblies; the stretching mechanism is drivingly connected to the two clamping assemblies to enable the two clamping assemblies to move synchronously in one of a direction approaching each other and a direction far away from each other; and the two clamping assemblies are detachably connected to the stretching mechanism. The device can improve the accuracy of test results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.