Measuring device
US11703494B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2020 |
| Grant date | Jul 18, 2023 |
| Priority date | — |
| Expiry date | Nov 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/129
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measuring apparatus for determining at least one measurand of a measuring medium includes a first measuring device including a first measuring sensor structured to contact the measuring medium and configured to detect measured values of the at least one measurand, the first measuring device embodied to determine a first measured value that is dependent on the at least one measurand of the measuring medium, a sampling device structured to remove a sample from the measuring medium, a second measuring device including a second measuring sensor and embodied to determine a second measured value that is dependent on the least one measurand of the sample, and an electronic control apparatus configured to receive and process the first and second measured value and to perform a verification, calibration and/or adjustment of the first measuring device using the second measured value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.