Patent · US Active

Abnormality predicting system and abnormality predicting method

US11703845B2 · kind B2 · utility

0Cited by
1References
20Claims
0Family size

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Key dates

Filing dateJul 4, 2019
Grant dateJul 18, 2023
Priority date
Expiry dateAug 7, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B23/0283
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An abnormality predicting system includes a processor and a memory having instructions. The instructions, when executed by the at least one processor, cause the at least one processor to execute operations including: inputting processing target data acquired from a target device; storing information related to an abnormality prediction of the processing target data; calculating an abnormality degree of the processing target data; executing processing related to the abnormality prediction including a failure occurrence prediction using a latest abnormality degree transition and a past abnormality degree transition of the processing target data; and generating a display screen for displaying a processing result including an abnormality degree transition and a result of the failure occurrence prediction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.