Equipment failure diagnostics using Bayesian inference
US11703846B2 · kind B2 · utility
0Cited by
7References
20Claims
0Family size
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Key dates
| Filing date | May 28, 2020 |
| Grant date | Jul 18, 2023 |
| Priority date | — |
| Expiry date | Aug 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based on the event, determining whether the second processing unit experienced a coincident event, if the second processing unit experienced a coincident event, remediating a condition of the second processing unit that caused the coincident event, and updating the coincidence probability array based on the event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.