Leakage degradation control and measurement
US11703927B2 · kind B2 · utility
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Key dates
| Filing date | Mar 27, 2020 |
| Grant date | Jul 18, 2023 |
| Priority date | — |
| Expiry date | Aug 22, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A performance management scheme for a processor based on leakage current measurement in field. The scheme performs the operations of detection and correction. The operation of detection measures per core leakage current in the field (e.g., using voltage regulator electrical current counters). The operation of correction changes the processor power management behavior. For example, processor cores showing high leakage degradation may be logically swapped with cores showing low leakage degradation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.