Pulsed high current technique for characterization of device under test
US11705894B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Aug 24, 2020 |
| Grant date | Jul 18, 2023 |
| Priority date | — |
| Expiry date | Mar 21, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.