Patent · US Active

Measurement apparatus of wavefront and polarization profile of vectorial optical fields

US11709097B2 · kind B2 · utility

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4References
10Claims
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Key dates

Filing dateJul 19, 2021
Grant dateJul 25, 2023
Priority date
Expiry dateAug 26, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2009/0265
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.