Method for detecting a defect in a zone of interest of an optical lens
US11709110B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 21, 2019 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Mar 29, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method for detecting a defect in a zone of interest of an optical lens, the method including: an image reception step, during which a plurality of images is received, each image includes a view of the zone of interest in front of a plurality of specific patterns, each specific pattern including a bright area and a dark area, and at least one image received is saturated in light intensity; a sampling step, during which each image of the plurality of images are sampled based on a common sampling pattern; a recombination step, during which a recombined image of the zone of interest is determined based on the common sampling pattern; and a defect detection step, during which a defect is detected in the zone of interest of the optical lens based on an analysis of the recombined image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.