Apparatus and method for inspection of a material
US11709150B2 · kind B2 · utility
0Cited by
12References
17Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 23, 2021 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Dec 23, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.