Machine learned model framework for screening question generation
US11710070B2 · kind B2 · utility
1Cited by
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20Claims
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Key dates
| Filing date | Apr 20, 2020 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Nov 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/022
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an example embodiment, a screening question-based online screening mechanism is provided to assess job applicants automatically. More specifically, job-specific questions are automatically generated and asked to applicants to assess the applicants using the answers they provide. Answers to these questions are more recent than facts contained in a user profile and thus are more reliable measures of an appropriateness of an applicant's skills for a particular job.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.