Method, system and apparatus for detecting device malfunctions
US11711259B2 · kind B2 · utility
1Cited by
3References
34Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 12, 2021 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Aug 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/1273
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.