Systems and methods for calibrating display systems
US11711500B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2022 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Jan 31, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/02
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of calibrating a display system, the method comprising: displaying a test pattern including a plurality of blobs; detecting one or more base blobs in the displayed test pattern; identifying, based on the detected base blobs, patches of the test pattern, wherein each patch comprises one of the base blobs and a subset of additional blobs detected in the displayed test pattern; determining a patch location for at least one patch within the test pattern based on the subset of the additional blobs in the patch to determine a blob location for at least one detected blob; determining a calibration parameter for the display system based on the blob location and a detected attribute of the at least one detected blob; and calibrating the projector using the calibration parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.