Optical scanning for industrial metrology
US11712837B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2021 |
| Grant date | Aug 1, 2023 |
| Priority date | — |
| Expiry date | May 23, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for additive manufacturing includes forming an object including depositing a first material including a first coloring component and a second material including a second coloring component, wherein both the first material and the second material further include a corresponding fluorescent component, scanning the object, including causing an emission of an optical signal from the object, wherein the emission of the optical signal is caused at least in part by an emission from the fluorescent components interacting with the first coloring component and the second coloring component as it passes from the fluorescent components to the surface of the object, sensing the emission of the optical signal, and determining presence of the first material and the second material based at least in part on the sensed emission of the optical signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.