Measurements using systems having multiple spectrometers
US11714004B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2019 |
| Grant date | Aug 1, 2023 |
| Priority date | — |
| Expiry date | Apr 16, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/425
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example system includes a first spectrometer, a second spectrometer, and an electronic control device communicatively coupled to the first spectrometer and the second spectrometer. The first spectrometer is operable to emit first light using a first light source towards a sample region between the first spectrometer and the second spectrometer. The first spectrometer is also operable to measure first reflected light reflected using a first photodetector from an object in the sample region. The second spectrometer is operable to measure first transmitted light transmitted through the object using a second photodetector. The electronic control device is operable to determine, based on at least one of the measured first reflected light or the measured first transmitted light, a spectral distribution of light corresponding to the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.