Patent · US Active

Automated testing of add-on configurations for searching event data using a late-binding schema

US11714799B1 · kind B1 · utility

1Cited by
15References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 29, 2021
Grant dateAug 1, 2023
Priority date
Expiry dateJan 13, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/24573
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Described are techniques for evaluating technology add-ons used with a data intake and query system to identify errors that may be present in or associated with configuration files defining the functions of the technology add-on or with operation of the technology add-on. For example, the technology add-on may be used to provide searching of event data stored by the data intake and query system using a late-binding schema, where the technology add-on provides for formalized interpretation of non-standard event data according to a user- or vendor-defined scheme. The disclosed techniques can identify errors and determine if the technology add-on is compliant with a schema definition for a common information model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.