Patent · US Active

Computerized creation of measurement plans and plan-based control of measurement devices

US11719534B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Markus Ritter · Adliswil, CH
Kilian Neumaier · Heidenheim, DE
Steffen Hersacher · Faulenmühle, DE

Key dates

Filing date	Mar 5, 2021
Grant date	Aug 8, 2023
Priority date	—
Expiry date	Aug 26, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01Q30/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method creates a measurement plan of a dimensional measuring apparatus or controls a measurement of the dimensional measuring apparatus. The method includes receiving setting parameters defining a measurement or control command of multiple measurement or control commands of the dimensional measuring apparatus. The method includes evaluating the setting parameters based on at least one of a statistical evaluation and an evaluation using machine-assisted learning. The method includes determining a presetting that assigns at least one setting parameter of the evaluated setting parameters to the measurement or control command. The method includes outputting a setting parameter proposal based on the determined presetting in response to receiving an input command for selecting the measurement or control command.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.