Method for producing a void fraction error curve using a device to measure a property of a multi-phase flow
US11719611B2 · kind B2 · utility
0Cited by
5References
18Claims
0Family size
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Key dates
| Filing date | Sep 11, 2019 |
| Grant date | Aug 8, 2023 |
| Priority date | — |
| Expiry date | Apr 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F1/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method produces a void fraction (VF) error curve which correlates an apparent VF with the actual VF of a multi-phase flow, the method comprising (a) using a device to measure a property of the multi-phase flow from which an apparent VF may be calculated; (b) calculating the apparent VF using the measured property from the device; (c) determining the actual VF of the multiphase flow using a radiometric densitometer; (d) using the values from steps (b) and (c) to calculate the VF error; (e) repeating steps (b) through (d) for all expected flow conditions to generate a VF error curve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.