X-ray instrument with ambient temperature detector
US11719654B2 · kind B2 · utility
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Key dates
| Filing date | Apr 6, 2021 |
| Grant date | Aug 8, 2023 |
| Priority date | — |
| Expiry date | Jun 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/507
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray analyzer comprises at least one detector configured to detect a secondary X-ray from a test object irradiated by an X-ray source, and provide a corresponding energy signal; a temperature sensor configured to sense a temperature related to the detector; and a signal processor configured to process the energy signal and provide a temperature compensated output for an X-ray event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.