Device and method for inspecting process, and electronic control device
US11720506B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2021 |
| Grant date | Aug 8, 2023 |
| Priority date | — |
| Expiry date | Nov 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2213/0016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The embodiments of the present disclosure relate to a device and method for inspecting process and an electronic control device. The device for inspecting process may include a converting controller configuring to be controlled for, when a preset operation is performed in a serial communication, converting into at least one process monitoring message by inputting a specific value into a dummy area included in at least one message corresponding to the preset operation, and an inspecting controller configuring to be controlled for inspecting a process based on the process monitoring message.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.