Continuous feature-independent determination of features for deviation analysis
US11720579B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2021 |
| Grant date | Aug 8, 2023 |
| Priority date | — |
| Expiry date | Oct 7, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/0202
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods include determination, for each of a plurality of discrete features, of statistics based on a number of occurrences of each discrete value of the discrete feature in the data, determination of first summary statistics based on the determined statistics, determine of a dissimilarity for each discrete feature based on the first summary statistics and on the statistics determined for the discrete feature, determination of candidate discrete features based on the determined dissimilarities, determination, for each of the candidate discrete features, of second summary statistics based on values of a continuous feature associated with each discrete value of the candidate discrete feature, determination of a deviation score for each of the candidate discrete features based on the second summary statistics, and transmission of the candidate discrete features for display in association with the continuous feature based on the determined deviation scores.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.