Patent · US Active

Intersection testing for ray tracing

US11721060B2 · kind B2 · utility

0Cited by
1References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 30, 2021
Grant dateAug 8, 2023
Priority date
Expiry dateSep 30, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2210/52
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system and method for performing intersection testing of rays in a ray tracing system. The ray tracing system uses a hierarchical acceleration structure comprising a plurality of nodes, each identifying one or more elements able to be intersected by a ray. The system iteratively obtains ray requests, each of which identifies a ray and a node against which the ray is to be tested, and performs intersection testing based on the ray requests. The number of ray requests obtained in each iteration reduces responsive to an amount of memory occupied by information relating to the rays (undergoing intersection testing) increasing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.