Patent · US Active

Self-aligned contact

US11721728B2 · kind B2 · utility

0Cited by
8References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2020
Grant dateAug 8, 2023
Priority date
Expiry dateNov 6, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6219

Abstract

The present disclosure relates to semiconductor structures and, more particularly, to self-aligned contacts and methods of manufacture. The structure includes: adjacent diffusion regions located within a substrate material; sidewall structures above an upper surface of the substrate material, aligned on sides of the adjacent diffusion regions; and a contact between the sidewall structures and extending to within the substrate material between and in electrical contact with the adjacent diffusion regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.