Patent · US Active

Methods of identifying schizophrenia patients at risk for relapse

US11723569B2 · kind B2 · utility

0Cited by

3References

20Claims

0Family size

Assignee

Janssen Pharmaceuticals, Inc. · BE

Inventors

Dai Wang · Blue Bell, US
Srihari Gopal · Montgomery, US
Vaibhav Narayan · Princeton, US
Adam Savitz · Greenwich, US
Susan Baker · Pennington, US

Key dates

Filing date	Nov 21, 2017
Grant date	Aug 15, 2023
Priority date	—
Expiry date	Mar 19, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01N2800/54
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention provides methods of identifying schizophrenia patients at risk for relapse. The invention also provides methods of early detection of schizophrenic relapse. The disclosed methods use monitoring of a subset of symptoms and/or one or more biomarkers. The symptom severity can be assessed using the Positive and Negative Syndrome Scale (PANSS) parameters. The methods of the invention can be used to provide early intervention to decrease or prevent relapse in schizophrenia patients.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.