Distance meter comprising SPAD arrangement for consideration of multiple targets

US11725935B2 · kind B2 · utility

Assignee

• HEXAGON TECHNOLOGY CENTER GMBH · CH

Inventors

• Jürg Hinderling · Interlaken, CH
• Simon BESTLER · Oberdorf, DE
• Thomas PIOK · Koblach, AT
• Andreas Walser · Sankt Gallen, CH
• Rainer WOHLGENANNT · Klaus, AT

Key dates

• Filing date: Jul 30, 2018
• Grant date: Aug 15, 2023
• Expiry date: Sep 25, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S17/10
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A distance meter for the high-accuracy single-point distance measurement to a target point by means of an oriented emitted beam, wherein the receiver has an optoelectronic sensor based on an arrangement of microcells for acquiring the received beam. The receiver and a computer unit are configured in this case for deriving a set of runtimes with respect to different cross-sectional components of the received beam acquired using subregions of the receiver, and therefore, for example, an evaluation is enabled as to whether the received beam has parts of the emitted beam reflected on a single target or a multiple target in its lateral extension.