Systems and methods for detecting counterfeit or defective memory

US11728000B1 · kind B1 · utility

Assignee

• Board of Trustees of the Univeristy of Alabama, for and on behalf of the University of Alabama in Huntsville · US

Inventors

• Biswajit Ray · Huntsville, US
• Umeshwarnath Surendranathan · Huntsville, US
• Preeti Kumari · San Diego, US
• Md Raquibuzzaman · Huntsville, US

Key dates

• Filing date: May 13, 2021
• Grant date: Aug 15, 2023
• Expiry date: May 13, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C2029/5006
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A system for testing memory includes logic that is configured to perform various normal memory operations (e.g., erase, read and write operations) on a memory device and to determine operational parameters associated with the memory operations. As an example, the amount of time to perform one or more memory operations may be measured, a number of errors resulting from the memory operations may be determined, or a number of memory cells storing noisy bits may be identified. One or more of the operational parameters may then be analyzed to determine whether they are in a range expected for counterfeit or defective memory. If so, the logic determines that the memory under test is counterfeit or defective and provides a notification about such determination.