Patent · US Active

Standard mask apparatus and method of manufacturing standard mask apparatus

US11732347B2 · kind B2 · utility

3Cited by
35References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2021
Grant dateAug 22, 2023
Priority date
Expiry dateJun 11, 2041

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49863
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A standard mask apparatus includes at least one standard mask including at least one through-hole. The standard mask apparatus may include standard regions each including the at least one through-hole. The standard regions may be arranged in a first direction and in a second direction that intersects with the first direction. A ratio of a dimension of each standard region in the first direction to a dimension of an interval between two of the standard regions in the first direction may be higher than or equal to 0.1. A ratio of a dimension of each standard region in the second direction to a dimension of an interval between the two standard regions in the second direction may be higher than or equal to 0.1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.