Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror
US11733185B2 · kind B2 · utility
4Cited by
59References
6Claims
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Key dates
| Filing date | Dec 29, 2020 |
| Grant date | Aug 22, 2023 |
| Priority date | — |
| Expiry date | Feb 27, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/6116
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This fluorescent X-ray analysis apparatus is provided with an X-ray irradiation unit 20 for irradiating a sample S with: X-rays, having an energy that exceeds the energy absorption edge value of Ag which is selected as a measurement target element, and that is no greater than the energy absorption edge value of Sn which is an adjacent element having a higher energy absorption edge value than Ag; and X-rays having an energy exceeding the energy absorption edge value of Sn which is selected as a measurement target element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.