Patent · US Active

Method and device for testing a component non-destructively

US11733211B2 · kind B2 · utility

0Cited by

4References

17Claims

0Family size

Assignee

Siemens Energy Global GmbH & Co. KG · DE

Inventors

Philipp Kahlert · Solingen, DE
Michael Opheys · Nettetal, DE
Andreas Sperling · Duisburg, DE

Key dates

Filing date	Jan 17, 2019
Grant date	Aug 22, 2023
Priority date	—
Expiry date	Mar 29, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/2693
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a component non-destructively, particularly for internal defects, includes the following steps: a) providing a rotationally symmetrical component having a plurality of preferably cylindrical recesses, which are arranged at one or more hole circles, b) arranging a transmitter probe serving as an ultrasound transmitter and a receiver probe serving as an ultrasound receiver spaced apart from each other outside the component such that ultrasound waves can be irradiated into a shaded area located behind one of the recesses in the component by the transmitter probe and ultrasound waves which are diffracted at least at one defect present in the shaded area can be received by the receiver probe, and c) using time of flight to determine whether one or more faults are present in the shaded area. An apparatus carries out such a method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.