Patent · US Active

Workload instrument masking

US11733253B2 · kind B2 · utility

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0References
17Claims
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Assignee

Inventor

Key dates

Filing dateDec 11, 2020
Grant dateAug 22, 2023
Priority date
Expiry dateMar 17, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N35/00871
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method to optimize analyzer use in a laboratory having a plurality of analyzers based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers minus one analyzer if the current laboratory workload is below a threshold criteria and if there are two or more analyzers in the plurality of analyzers, masking one of the plurality of analyzers if the current workload is met by the plurality of analyzers minus one analyzer, proceeding with current workload, and repeating the above steps until the current laboratory workload has been completed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.